SEQUOIA Newsletters

• SEQUOIA News Vol 8, No. 1, Q4 2009.
• SEQUOIA News Vol 6, No. 1, Q2 2007.
• SEQUOIA News Vol 4, No. 1, Q1 2005.
• SEQUOIA News Vol 3, No. 2, Q2 2004.
• SEQUOIA News Vol 3, No. 1, Q1 2004.
• SEQUOIA News Vol 2, No. 2, Q4 2003.
• SEQUOIA News Vol 2, No. 1, Q3 2003.
• SEQUOIA News Vol 1, No. 2, Q2 2002.
• Inaugural issue SEQUOIA News Vol 1, No. 1, Q1 2002.

Recent Papers:

• Michael C. Smayling, Valery Axelrad, "32nm and below Logic Patterning using Optimized Illumination and Double Patterning", SPIE Microlithography, Feb. 2009
  
• Koichiro Tsujita, Koji Mikami, Hiroyuki Ishii, Ryo Nakayama, Mikio Arakawa, Takehiro Ueno, Shogo Fujie, and Kazuhiro Takahashi , "Innovative pattern matching method considering process margin and scanner design information", SPIE Microlithography, Feb. 2009
  

• SEQUOIA ESD: SCR-based ESD protection
• SEQUOIA ESD: Grounded-Gate MOSFET ESD Protection
• SEQUOIA ESD: Cascoded NMOS Output Buffer Design.
• SEQUOIA ESD: Physical Simulation of Charged Device Model ESD Events.
• Shallow Trench Isolation Analysis and Design.